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Description
Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Table of Contents
Synchrotron X-ray phase nano-tomography for bone tissue characterization.- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography.- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter.- XAFS for characterization of nanomaterials.- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy.- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells.- In situ SXS and XAFS measurements of electrochemical interface.- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species.- In situ X-ray reciprocal space mapping for characterization of nanomaterials.- X-ray powder diffraction characterization of nanomaterials.- X-ray absorption fine structure analysis of catalytic nanomaterials.- Contribution of small angle X-ray andneutron scattering (SAXS & SANS) to the characterization of natural nano-materials.- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials.- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.
