The FET Centennial : Celebrating the Field-Effect Transistor
  • 洋書
  • 予約

The FET Centennial : Celebrating the Field-Effect Transistor  Hardcover,  言語:ENG

Yang, Cary Y. (EDT)/ Claeys, Cor (EDT)/ Nathan, Arokia (EDT)

  • ウェブストア価格 ¥23,470(本体¥21,337)
  • Wiley-IEEE Press(2026/08発売)
  • ポイント 213pt
  • ご予約受付中。出版後の入荷・発送
Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)
  • 洋書

Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)  Paperback,  言語:ENG

Claeys, Cor/ Simoen, Eddy

  • ウェブストア価格 ¥44,771(本体¥40,701)
  • Springer Nature Switzerland AG(2019/01発売)
  • ポイント 407pt
  • 海外取次在庫
Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)
  • 洋書
  • 電子版あり

Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)  Hardcover,  言語:ENG

Claeys, Cor/ Simoen, Eddy

  • ウェブストア価格 ¥44,771(本体¥40,701)
  • Springer International Publishing AG(2018/08発売)
  • ポイント 407pt
  • 海外取次在庫
Random Telegraph Signals in Semiconductor Devices (Iop Expanding Physics)
  • 洋書

Random Telegraph Signals in Semiconductor Devices (Iop Expanding Physics)  Hardcover,  言語:ENG

Simoen, Eddy/ Claeys, Cor

  • ウェブストア価格 ¥35,594(本体¥32,359)
  • Institute of Physics Publishing(2016/11発売)
  • ポイント 323pt
  • 海外取次在庫
Extended Defects in Germanium : Fundamental and Technological Aspects (Springer Series in Materials Science 118)
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Extended Defects in Germanium : Fundamental and Technological Aspects (Springer Series in Materials Science 118)  Paperback

Claeys, Cor/ Simoen, Eddy

  • Springer(2010/11発売)
  • ご注文いただけません
Germanium-Based Technologies : From Materials to Devices
  • 洋書
  • 電子版あり

Germanium-Based Technologies : From Materials to Devices  Hardcover,  言語:ENG

Claeys, Cor (EDT)/ Simoen, Eddy (EDT)

  • ウェブストア価格 ¥47,012(本体¥42,739)
  • Elsevier Science Ltd(2007/03発売)
  • ポイント 427pt
  • 海外からお取り寄せ(通常6~9週間)
Gettering and Defect Engineering in Semiconductor Technology VII (Solid State Phenomena)
  • 洋書

Gettering and Defect Engineering in Semiconductor Technology VII (Solid State Phenomena)  Paperback,  言語:ENG

Claeys, Cor (EDT)/ Vanhellemont, Jan (EDT)/ Richter, Hans (EDT)

  • Trans Tech Publications Ltd(1997/07発売)
  • ご注文いただけません