Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
  • 洋書

Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)  Hardcover,  言語:ENG

Ubar, Raimund (EDT)

  • ウェブストア価格 ¥40,296(本体¥36,633)
  • IGI Global(2011/03発売)
  • ポイント 366pt
  • 海外取次在庫
Design and Test Technology for Dependable Systems-on-Chip
  • 洋書

Design and Test Technology for Dependable Systems-on-Chip  言語:ENG

Ubar, Raimund (EDT)/ Raik, Jaan (EDT)/ Vierhaus, Heinrich Theodor (EDT)

  • Information Science Reference(2010/12発売)
  • ご注文いただけません
Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)
  • 洋書

Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)  Paperback,  言語:ENG

Ubar, Raimund/ Raik, Jaan/ Jenihhin, Maksim

  • ウェブストア価格 ¥57,020(本体¥51,837)
  • Birkhauser Verlag AG(2025/02発売)
  • ポイント 518pt
  • 海外からお取り寄せ(通常6~9週間)
Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)
  • 洋書
  • 電子版あり

Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)  Hardcover

Ubar, Raimund/ Raik, Jaan/ Jenihhin, Maksim

  • ウェブストア価格 ¥55,964(本体¥50,877)
  • Birkhauser Verlag AG(2024/01発売)
  • ポイント 508pt
  • 海外取次在庫