1～5件／全5件 セーフサーチON
  •  
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I
  • 洋書

VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I  Paperback,  言語：ENG

Hollstein, Thomas (EDT)/ Raik, Jaan (EDT)/ Kostin, Sergei (EDT)

  • ウェブストア価格 ¥12,827（本体¥11,661）
  • Springer International Publishing AG（2018/08発売）
  • ポイント 116pt
  • 海外からお取り寄せ（通常6～9週間）
Design and Test Technology for Dependable Systems-on-Chip
  • 洋書

Design and Test Technology for Dependable Systems-on-Chip  言語：ENG

Ubar, Raimund (EDT)/ Raik, Jaan (EDT)/ Vierhaus, Heinrich Theodor (EDT)

  • Information Science Reference（2010/12発売）
  • ご注文いただけません
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I
  • 洋書
  • 電子版あり

VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I  Hardcover

Hollstein, Thomas (EDT)/ Raik, Jaan (EDT)/ Kostin, Sergei (EDT)

  • Springer International Publishing AG（2017/09発売）
  • ご注文いただけません
Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)
  • 洋書

Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)  Paperback,  言語：ENG

Ubar, Raimund/ Raik, Jaan/ Jenihhin, Maksim

  • ウェブストア価格 ¥57,020（本体¥51,837）
  • Birkhauser Verlag AG（2025/02発売）
  • ポイント 518pt
  • 海外からお取り寄せ（通常6～9週間）
Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)
  • 洋書
  • 電子版あり

Structural Decision Diagrams in Digital Test : Theory and Applications (Computer Science Foundations and Applied Logic)  Hardcover

Ubar, Raimund/ Raik, Jaan/ Jenihhin, Maksim

  • ウェブストア価格 ¥55,964（本体¥50,877）
  • Birkhauser Verlag AG（2024/01発売）
  • ポイント 508pt
  • 海外取次在庫
1～5件／全5件
  •