VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I

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VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability : 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers (I

Hollstein, Thomas (EDT)/ Raik, Jaan (EDT)/ Kostin, Sergei (EDT)

Springer International Publishing AG（2017/09発売）

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製本 Hardcover:ハードカバー版／ページ数 233 p.
商品コード 9783319671031

Full Description

This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.