ナノスケール材料の光学的電子的特性<br>Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science)
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ナノスケール材料の光学的電子的特性
Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science)
 Hardcover,  言語:ENG

Diebold, Alain/ Hofmann, Tino

  • ウェブストア価格 ¥39,534(本体¥35,940)
  • Springer Nature Switzerland AG(2022/01発売)
  • ポイント 359pt
  • オンデマンド(OD/POD)版です。キャンセルは承れません。
Handbook of Silicon Semiconductor Metrology
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Handbook of Silicon Semiconductor Metrology  Paperback,  言語:ENG

Diebold, Alain C. (EDT)

  • ウェブストア価格 ¥20,863(本体¥18,967)
  • CRC Press(2019/10発売)
  • ポイント 189pt
  • 海外からお取り寄せ(通常6~9週間)
Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science)
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Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science)  Paperback

Diebold, Alain/ Hofmann, Tino

  • ウェブストア価格 ¥39,534(本体¥35,940)
  • Springer Nature Switzerland AG(2023/01発売)
  • ポイント 359pt
  • 海外取次在庫
Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings) (2011)
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Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings) (2011)  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ McDonald, Robert (EDT)

  • American Institute of Physics(2012/04発売)
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Characterization and Metrology for ULSI Technology 2003 : 2003 International Conference on Characterization and Metrology for ULSI Technology (Aip Conference Proceedings)
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Characterization and Metrology for ULSI Technology 2003 : 2003 International Conference on Characterization and Metrology for ULSI Technology (Aip Conference Proceedings)  Hardcover,  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ Shaffner, Thomas J. (EDT)

  • American Institute of Physics(2003/10発売)
  • ご注文いただけません
Frontiers of Characterization and Metrology for Nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology (Aip Conference Proceedings / Materials Physics and Applications) (2007)
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Frontiers of Characterization and Metrology for Nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology (Aip Conference Proceedings / Materials Physics and Applications) (2007)  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ McDonald, Robert (EDT)

  • American Institute of Physics(2007/09発売)
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Semiconductor Characterization : Present Status and Future Needs
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Semiconductor Characterization : Present Status and Future Needs  Hardcover,  言語:ENG

Bulis, W.Murray/ etc.

  • American Institute of Physics(1996/01発売)
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