Applied Measurement with jMetrik

個数:1
紙書籍版価格
¥52,940
  • 電子書籍
  • ポイントキャンペーン

Applied Measurement with jMetrik

  • 著者名:Meyer, J. Patrick
  • 価格 ¥11,610 (本体¥10,555)
  • Routledge(2014/06/13発売)
  • 麗しの桜!Kinoppy 電子書籍・電子洋書 全点ポイント25倍キャンペーン(~3/29)
  • ポイント 2,625pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)
  • 言語:ENG
  • ISBN:9780415531955
  • eISBN:9781136294167

ファイル: /

Description

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

Table of Contents

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

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