Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics .10) （2. Aufl. 2013. X, 256 S. 85 SW-Abb., 5 Farbabb. 235 mm）

Breitenstein, Otwin/ Warta, Wilhelm/ Langenkamp, Martin

SPRINGER, BERLIN; SPRINGER（2013発売）

• 製本 Paperback:紙装版/ペーパーバック版
• 商品コード 9783642264788

Full Description

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

Contents

Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.