Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics .10) (2. Aufl. 2013. X, 256 S. 85 SW-Abb., 5 Farbabb. 235 mm)
  • 洋書
  • ポイントキャンペーン

Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics .10) (2. Aufl. 2013. X, 256 S. 85 SW-Abb., 5 Farbabb. 235 mm)  Paperback

Breitenstein, Otwin/ Warta, Wilhelm/ Langenkamp, Martin

  • SPRINGER, BERLIN; SPRINGER(2013発売)
  • ご注文いただけません