基本説明
走査プローブ顕微鏡法シリーズ（2004-2008年完結）にお求め安いシリーズ全巻セット価格が設定されました。
Full Description
Originally published as seperate volumes this series is now available as a full set: a savings of over 40%.
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
With this field progressing so fast, the volumes of this series comprise the state of the art of and the progress in the development of the SPM techniques itself, characterization methods as well as biomimetics and industrial application areas.
