Contactless VLSI Measurement and Testing Techniques

Sayil, Selahattin

Springer International Publishing AG（2017/12発売）

• 製本 Hardcover:ハードカバー版／ページ数 93 p.
• 言語 ENG
• 商品コード 9783319696720

Full Description

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.