Post-Silicon Validation and Debug

Mishra, Prabhat (EDT)/ Farahmandi, Farimah (EDT)

Springer Nature Switzerland AG（2018/12発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 394 p.
• 言語 ENG
• 商品コード 9783030074548

Full Description

This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts.  The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs. 

Contents

Part 1. Introduction.- Post-Silicon SoC Validation Challenges.- Part 2. Debug Infrastructure.- SoC Instrumentations: Pre-silicon Preparation for Post-silicon Readiness.- Structure-based Signal Selection for Post-silicon Validation.- Simulation-based Signal Selection.- Hybrid Signal Selection.- Post-Silicon Signal Selection using Machine Learning.- Part 3. Generation of Tests and Assertions.- Observability-aware Post-Silicon Test Generation.- On-chip Constrained-Random Stimuli Generation.- Test Generation and Lightweight Checking for Multi-core Memory Consistency.- Selection of Post-Silicon Hardware Assertions.- Part 4. Post-Silicon Debug.- Debug Data Reduction Techniques.- High-level Debugging of Post-silicon Failures.- Post-silicon Fault Localization with Satisfiability Solvers.- Coverage Evaluation and Analysis of Post-silicon Tests with Virtual Prototypes.- Utilization of Debug Infrastructure for Post-Silicon Coverage Analysis.- Part 5. Case Studies.- Network-on-Chip Validation and Debug.- Post-silicon Validation of the IBM Power8 Processor.- Part 6. Conclusion and Future Directions.- SoC Security versus Post-Silicon Debug Conflict.- The Future of Post-Silicon Debug.