Atomic Force Microscopy in Process Engineering : An Introduction to AFM for Improved Processes and Products

Bowen, W. Richard/ Hilal, Nidal

Butterworth-Heinemann Ltd（2009/07発売）

• 製本 Hardcover:ハードカバー版／ページ数 304 p.
• 言語 ENG
• 商品コード 9781856175173
• DDC分類 660.284

Full Description

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.

Contents

Basic Principles of Atomic Force Microscopy; Measurement of Particle and Surface Interactions Using Force Microscopy; Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; Investigating Membranes and Membrane Processes with Atomic Force Microscopy; AFM and Development of (Bio)Fouling Resistant Membranes; Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; Micro/Nanoengineering and AFM for Cellular Sensing; Atomic Force Microscopy and Polymers on Surfaces; Application of AFM for the Study of Tensile and Microrheological Properties of Fluids; Future Prospects