Advances in Optics of Charged Particle Analyzers: Part 1 (Advances in Imaging and Electron Physics)

Hawkes, Peter W. (EDT)/ Hÿtch, Martin (EDT)

Academic Press Inc（2024/11発売）

• 製本 Hardcover:ハードカバー版／ページ数 232 p.
• 言語 ENG
• 商品コード 9780443297861
• DDC分類 621.3822

Full Description

Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Contents

Preface
1. Charged Particles in Electromagnetic Fields
Mikhail Yavor
2. Language of Aberration Expansions in Charged Particle Optics
Mikhail Yavor
3. Transporting Charged Particle Beams in Static Fields
Mikhail Yavor
4. Transporting Charged Particles in Radiofrequency Fields
Mikhail Yavor
5. Transporting and Separating Ions in Gas-Filled Channels
Mikhail Yavor
6. Static Magnetic Charged Particle Analyzers
Mikhail Yavor