Advances in Electronic Testing : Challenges and Methodologies (Frontiers in Electronic Testing) 〈Vol. 27〉 （1st ed. 2006. 2nd printing）

Gizopoulos, D. (EDT)

Springer（2007/01発売）

• 製本 Hardcover:ハードカバー版／ページ数 412 p.
• 言語 ENG
• 商品コード 9780387294087

基本説明

Written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, and more.

Full Description

Part of "Frontiers in Electronic Testing" book series, this book describes various advances in electronic circuits testing.