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Full Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
Contents
Introduction
Chapter 1. Atom Probe Fundamentals
Chapter 2. Field Ion Emission Mechanisms
Chapter 3. Field Ion Microscopy
Chapter 4. Specimen Preparation by Focused Ion Beam
Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements
Chapter 6. Atom Probe Tomography Detectors
Chapter 7. 3D Reconstructions
Chapter 8. Laser Assisted Field Evaporation
Chapter 9. Data Mining
Chapter 10. Correlative Microscopy by APT and (S)TEM
Chapter 11. Combining APT and Spectroscopy
Conclusion
Appendix
Index
