Characterization and Metrology for ULSI Technology 2003 : 2003 International Conference on Characterization and Metrology for ULSI Technology (Aip Conference Proceedings)
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Characterization and Metrology for ULSI Technology 2003 : 2003 International Conference on Characterization and Metrology for ULSI Technology (Aip Conference Proceedings)  Hardcover,  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ Shaffner, Thomas J. (EDT)

  • American Institute of Physics(2003/10発売)
  • ご注文いただけません
Frontiers of Characterization and Metrology for Nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology (Aip Conference Proceedings / Materials Physics and Applications) (2007)
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Frontiers of Characterization and Metrology for Nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology (Aip Conference Proceedings / Materials Physics and Applications) (2007)  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ McDonald, Robert (EDT)

  • American Institute of Physics(2007/09発売)
  • ご注文いただけません
Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings)
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Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings)  Hardcover,  言語:ENG

Secula, Erik M. (EDT)/ Seiler, David G. (EDT)/ Khosla, Rajinder P. (EDT)

  • American Institute of Physics(2009/10発売)
  • ご注文いただけません
Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings) (2011)
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Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings) (2011)  言語:ENG

Seiler, David G. (EDT)/ Diebold, Alain C. (EDT)/ McDonald, Robert (EDT)

  • American Institute of Physics(2012/04発売)
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Semiconductor Characterization : Present Status and Future Needs
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Semiconductor Characterization : Present Status and Future Needs  Hardcover,  言語:ENG

Bulis, W.Murray/ etc.

  • American Institute of Physics(1996/01発売)
  • ご注文いただけません
Life on Hold: Finding Hope in the Face of Serious Illness
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Life on Hold: Finding Hope in the Face of Serious Illness  Paperback

Seiler, David G./ Brunvoll, Laurel S.

  • ウェブストア価格 ¥3,118(本体¥2,835)
  • Multnomah Books(2006/06発売)
  • ポイント 28pt
  • オンデマンド(OD/POD)版です。キャンセルは承れません。
Sein Leben für die Berge - : Von ihm selbst erzählt - Die Bücher HIGH und FREE sowie ausgewählte Texte - Mit vielen Fotografien (2020. 480 S. 216 mm)
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Sein Leben für die Berge - : Von ihm selbst erzählt - Die Bücher HIGH und FREE sowie ausgewählte Texte - Mit vielen Fotografien (2020. 480 S. 216 mm)  Hardcover

Lama, David/ Herausgegeben von Klingler, Florian/ Seiler, Christian

  • ウェブストア価格 ¥6,431(本体¥5,847)
  • PENGUIN VERLAG MÜNCHEN(2020発売)
  • ポイント 58pt
  • 海外からお取り寄せ(通常6~9週間)
Investing for Better: Harnessing the Four Driving Forces of Asset Management to Build a Wealthier and More Equitable World
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Investing for Better: Harnessing the Four Driving Forces of Asset Management to Build a Wealthier and More Equitable World  Hardcover,  言語:ENG

Seiler, David/ Seiler, Daniel

  • ウェブストア価格 ¥7,079(本体¥6,436)
  • McGraw-Hill Education(2024/04発売)
  • ポイント 64pt
  • 海外からお取り寄せ(通常6~9週間)
Metrology and Diagnostic Techniques for Nanoelectronics
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  • 電子版あり

Metrology and Diagnostic Techniques for Nanoelectronics  Hardcover,  言語:ENG

Ma, Zhiyong (EDT)/ Seiler, David G. (EDT)

  • ウェブストア価格 ¥109,091(本体¥99,174)
  • Pan Stanford Publishing Pte Ltd(2016/10発売)
  • ポイント 991pt
  • 海外からお取り寄せ(通常6~9週間)