Thin Film and Depth Profile Analysis (Topics in Current Physics) (Reprint)
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Thin Film and Depth Profile Analysis (Topics in Current Physics) (Reprint)  Paperback,  言語:ENG

Oechsner, H. (EDT)/ Etzkorn, H.-W. (CON)/ Hofer, W. O. (CON)/ Hofmann,

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  • Springer Verlag(2012/07発売)
  • ポイント 223pt
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Sputtering by Particle Bombardment III : Characteristics of Sputtered Particles, Technical Applications (Topics in Applied Physics .64) (Softcover reprint of the original 1st ed. 1991. 2014. xv, 415 S. XV, 4)
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Sputtering by Particle Bombardment III : Characteristics of Sputtered Particles, Technical Applications (Topics in Applied Physics .64) (Softcover reprint of the original 1st ed. 1991. 2014. xv, 415 S. XV, 4)  Paperback

Mitarbeit: Behrisch, R./ Hauffe, W./ Hofer, W.O./ Laegreid, N./ McClanahan, E.D./ Herausgegeben von Behrisch, Rainer/ Wittmaack, Klaus

  • ウェブストア価格 ¥14,226(本体¥12,933)
  • SPRINGER, BERLIN; SPRINGER(2014発売)
  • ポイント 129pt
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