Structural, Syntactic, and Statistical Pattern Recognition〈1st ed. 2021〉 : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings

著者名：Torsello, Andrea (EDT)/Rossi, Luca (EDT)/Pelillo, Marcello (EDT)/Biggio, Battista (EDT)/Robles-Kelly, Antonio (EDT)

Springer（2021/04/09発売）

• 言語：ENG
• ISBN：9783030739720
• eISBN：9783030739737

Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Table of Contents

Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.