Description
Written by one of the very first practitioners of ICP-MS, Practical Guide to ICP-MS and Other Atomic Spectroscopy Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way. By comparing it with other complementary atomic spectroscopy (AS) techniques, it gives the trace element analysis user community a glimpse into why the technique was first developed and how the application landscape has defined its use today, 40 years after it was first commercialized in 1983.
What’s new in the 4th edition:
- Updated chapters on the fundamental principles and applications of ICP-MS
- New chapters on complementary AS techniques including AA, AF, ICP-OES, MIP-AES, XRF, XRD, LIBS, LALI-TOFMS
- Strategies for reducing errors and contamination with plasma spectrochemical techniques
- Comparison of collision and reaction cells including triple/multi quad systems
- Novel approaches to sample digestion
- Alternative sample introduction accessories
- Comprehensive glossary of terms used in AS
- New vendor contact information
The book is not only suited to novices and beginners, but also to more experienced analytical scientists who want to know more about recent ICP-MS developments, and where the technique might be heading in the future. Furthermore, it offers much needed guidance on how best to evaluate commercial AS instrumentation and what might be the best technique, based on your lab’s specific application demands.
"I feel honored to have been asked to deliver the Foreword for this book, which is suited not only for beginners, but also for more experienced analytical scientists who want to know the advances in plasma spectrochemistry instrumentation and related future opportunities."
-Dr. Heidi Goenaga Infante, LGC Science Fellow; Chief Scientist, National Measurement Laboratory, Visiting Professor, University of Strathclyde, UK.
Table of Contents
Contents
Foreword
Preface
Acknowledgements
Author Bio
Chapter 1: An Overview of ICP Mass Spectrometry
Chapter 2: Principles of Ion Formation
Chapter 3: Sample Introduction
Chapter 4: Plasma Source
Chapter 5: Interface Region
Chapter 6: Ion Focusing System
Chapter 7: Mass Analyzers: Quadrupole Technology
Chapter 8: Mass Analyzers: Double-Focusing Magnetic Sector Technology
Chapter 9: Mass Analyzers: Time-Of-Flight Technology
Chapter 10: Mass Analyzers: Collision/Reaction Cell and Interface Technology
Chapter 11: Ion Detection
Chapter 12: Peak Measurement Protocol
Chapter 13: Methods of Quantitation
Chapter 14: Review of Interferences
Chapter 15: Routine Maintenance
Chapter 16: Sampling and Sample Preparation Procedures
Chapter 17: Reducing Errors from Contamination
Chapter 18: Alternative Sampling Accessories
Chapter 19: Trace Element Speciation Techniques
Chapter 20: The ICP-MS Application Landscape
Chapter 21: Fundamental Principles and Applications of Atomic Absorption/Fluorescence
Chapter 22: Fundamental Principles and Applications of ICP Optical Emission Spectrometry
Chapter 23: Fundamental Principles of Applications of Other Atomic Spectroscopic Techniques
- X Ray Analytical Techniques (XRF/XRD)
- Microwave Induced Plasma Atomic Emission Spectrometry (MIP-AES)
- Laser Induced Breakdown Spectrometry (LIBS)
- Laser Ionization Laser Ablation Time-Of-Flight Mass Spectrometry (LALI-TOF-MS)
Chapter 24: Comparing ICP-MS With Other Atomic Spectroscopy Techniques
Chapter 25: Cost of Analysis of AS Techniques
Chapter 26: How to Select an ICP-MS: Some Important Analytical Considerations
Chapter 27: Glossary of Terms Used in Atomic Spectroscopy (AS)
Chapter 28: Useful Contact Information
