Transmission Electron Microscopy Characterization of Nanomaterials

個数:1
  • 電子書籍

Transmission Electron Microscopy Characterization of Nanomaterials

  • 著者名:Kumar, Challa S.S.R. (EDT)
  • 価格 ¥40,697 (本体¥36,998)
  • Springer(2013/12/09発売)
  • ポイント 369pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)
  • 言語:ENG
  • ISBN:9783642389337
  • eISBN:9783642389344

ファイル: /

Description

Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Table of Contents

TEM Characterization of Biological and Inorganic Nanocomposites.- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials.- TEM for Characterization of Semiconductor Nanomaterials.- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods.- TEM for Characterization of Core-Shell Nanomaterials.- Valence Electron Spectroscopy by Transmission Electron Microscopy.- TEM Characterization of Nanocomposite Materials.- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires.- Electron Microscopy for Characterization of Thermoelectric Nanomaterials.- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites.- TEM Characterization of Metallic Nanocatalysts.- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures

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