Progress in Nanoscale Characterization and Manipulation (Springer Tracts in Modern Physics)

Wang, Rongming (EDT)/ Wang, Chen (EDT)/ Zhang, Hongzhou (EDT)

Springer Verlag, Singapore（2018/09発売）

• 製本 Hardcover:ハードカバー版／ページ数 508 p.
• 言語 ENG
• 商品コード 9789811304538
• DDC分類 620

Full Description

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Contents

Electron/Ion Optics.- Scanning Electron Microscopy.- Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy (STEM).- Spectroscopy.- Aberration Corrected Transmission Electron Microscopy and Its Applications.- In situ TEM: Theory and Applications.- Helium Ion Microscopy.