Test Pattern Generation Using Boolean Proof Engines

Drechsler, Rolf/ Eggersglu, Stephan/ Fey, Gorschwin/ Tille, Daniel

Springer（2010/10発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 204 p.
• 言語 ENG
• 商品コード 9789048184910
• DDC分類 621

Full Description

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

Contents

Preliminaries.- Boolean Satisfiability.- SAT-Based ATPG.- Learning Techniques.- Multiple-Valued Logic.- Improved Circuit-to-CNF Conversion.- Branching Strategies.- Integration into Industrial Flow.- Delay Faults.- Summary and Outlook.