Transmission Electron Microscopy Characterization of Nanomaterials （2014）

Kumar, Challa S.S.R. (EDT)

Springer-Verlag Berlin and Heidelberg GmbH & Co. K（2013/12発売）

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製本 Hardcover:ハードカバー版／ページ数 717 p.
言語 ENG
商品コード 9783642389337
DDC分類 620.115

Full Description

Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

TEM Characterization of Biological and Inorganic Nanocomposites.- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials.- TEM for Characterization of Semiconductor Nanomaterials.- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods.- TEM for Characterization of Core-Shell Nanomaterials.- Valence Electron Spectroscopy by Transmission Electron Microscopy.- TEM Characterization of Nanocomposite Materials.- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires.- Electron Microscopy for Characterization of Thermoelectric Nanomaterials.- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites.- TEM Characterization of Metallic Nanocatalysts.- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures