Fault Analysis in Cryptography (Information Security and Cryptography)

Joye, M. (EDT)/ Tunstall, M. (EDT)

Springer（2012/06発売）

• 製本 Hardcover:ハードカバー版／ページ数 354 p.／サイズ 98 illus., 35 in color
• 商品コード 9783642296550

Full Description

Part III deals with fault analysis in public key cryptography, with chapters dedicated to classical RSA and RSA-CRT implementations, elliptic curve cryptosystems and countermeasures using fault detection, devices resilient to fault injection attacks, lattice-based fault attacks on signatures, and fault attacks on pairing-based cryptography.