走査プローブ顕微鏡と産業面への応用XII：キャラクタリゼーション Applied Scanning Probe Methods XII : Characterization (NanoScience and Technology)

Bhushan, B. (EDT)/ Fuchs, H. (EDT)

Springer（2008/11発売）

• 製本 Hardcover:ハードカバー版／ページ数 224 p.
• 言語 ENG
• 商品コード 9783540850380

Full Description

Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.