Transmission Electron Microscopy : Physics of Image Formation and Microanalysis (Series in Optical Sciences) (3RD)

Transmission Electron Microscopy : Physics of Image Formation and Microanalysis (Series in Optical Sciences) (3RD)

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  • 製本 Paperback:紙装版/ペーパーバック版/ページ数 545 p.
  • 言語 ENG
  • 商品コード 9783540568490
  • DDC分類 502.8

Full Description

This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.

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