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Full Description
The book starts with two introductory chapters on materials and nanomaterials to review the main concepts that will be used for explaining the methods later in the book. The main body of the book is divided in two parts dealing with the characterization of nanomaterials with photons and electron beams, respectively. Within each part, chapters focus on different characterization techniques, including microscopies and spectroscopies, using the corresponding probing beams. The book provides a range of examples from the literature and specially crafted graphic material to illustrate the main concepts. Complex mathematical developments are avoided and only the necessary mathematical formulas are used to get quantitative results so that the reader can quickly perform estimations of simple systems. With the same goal a set of tables is provided in the appendices with basic numerical parameters. The book is as self-contained as possible, with introductory sections in each part so that also beginners (including advanced students and PhD students) can follow the other chapters of the book. This is the perfect practical guide for anyone working with these methods and wanting to use them efficiently for obtaining the best and most reliable results.
Contents
Preface
Materials
Nanomaterials
PART I: PHOTONS
Optical Properties
Optical Characterization
Optical Spectroscopy
Infrared and Raman Spectroscopy
PART II: ELECTRONS
Electron Beams
Scanning Electron Microscopy
Transmission Electron Microscopy
Scanning-Transmission Electron Microscopy
Electron Energy-Loss Spectroscopy
Appendices
