Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)

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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)

Bai, Xiao (EDT)/ Hancock, Edwin R. (EDT)/ Ho, Tin Kam (EDT)

Springer International Publishing AG（2018/08発売）

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製本 Paperback:紙装版/ペーパーバック版／ページ数 524 p.
言語 ENG
商品コード 9783319977843

Full Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions.