VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers (Ifip Advances in Information and C

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VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers (Ifip Advances in Information and C

Shin, Youngsoo (EDT)/ Tsui, Chi Ying (EDT)/ Kim, Jae-Joon (EDT)

Springer International Publishing AG（2016/09発売）

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製本 Hardcover:ハードカバー版／ページ数 223 p.
商品コード 9783319460963

Full Description

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference.