VLSI Design and Test : 29th International Symposium, VDAT 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part I (Communications in Computer and Information Science)

VLSI Design and Test : 29th International Symposium, VDAT 2025, Chandigarh, India, August 7-9, 2025, Proceedings, Part I (Communications in Computer and Information Science)

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  • 製本 Paperback:紙装版/ペーパーバック版/ページ数 574 p.
  • 言語 ENG
  • 商品コード 9783032263049
  • DDC分類 621.395

Full Description

This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7-9, 2025.

The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures. 

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