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Full Description
This book describes new principles, methods and techniques for parametric optimization of integrated circuits, considering the influence of secondary negative factors on the normal operation of circuit components, such as change of environmental conditions, parasitics, leakage currents, aging, etc. The efficiency of the methods discussed is demonstrated by examples of practical designs, enabling readers to use them in similar integrated circuit designs. The authors demonstrate newly developed principles and methods of transforming the given circuit and constraints into a single-objective or multi-objective optimization problem, applying swarm intelligence optimization algorithms and machine learning strategies, with the goal of finding the global minimum with the least number of simulations. The observed circuit types include but are not limited to analog, mixed-signal, high performance heterogeneous integrated circuits as well as digital cores.
Contents
Development of design means for automated parametric optimization of digital integrated circuits.- Development of means to design integrated circuits taking into account ageing phenomena.- Development of means to improve the operational parameters and reliability of power supply and control systems embedded in integrated memory devices.- Development of means for reliability improvement in high-speed serial data receivers.- Development of means to improve the efficiency of information transmission systems between integrated circuits.- Development of means to mitigate the crosstalk in integrated circuits using machine learning.



