Reliability of CMOS Analog ICs (Analog Circuits and Signal Processing) （2025. xii, 94 S. XII, 94 p. 64 illus., 13 illus. in color. 235 mm）

Kuntman, Hakan/OEzenli, Deniz/Kaç/ar, Firat

SPRINGER, BERLIN; SPRINGER NATURE SWITZERLAND; SPRING（2025発売）

SPRINGER, BERLIN; SPRINGER NATURE SWITZERLAND; SPRING（2025発売）

• 製本 Hardcover:ハードカバー版／ページ数 100 p.
• 言語 ENG
• 商品コード 9783031854545

Full Description

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.

Contents

Introduction.- The reliability model for PMOS and NMOS transistors based on statistical methods.- Demonstration of Proposed Method with Application Examples.- On the degradation of OTA-C-based CMOS low-power filter circuits for biomedical instrumentation.- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.