High-Z Materials for X-ray Detection : Material Properties and Characterization Techniques

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High-Z Materials for X-ray Detection : Material Properties and Characterization Techniques

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  • 製本 Paperback:紙装版/ペーパーバック版/ページ数 246 p.
  • 商品コード 9783031209574

Full Description

This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.   

Contents

Chapter 1 High-Z Materials for X-ray and Gamma-ray Detection in Medical Imaging.- Chapter 2 Large Area Thin Film CdTe as the Next Generation X-ray Detector for Medical Imaging Applications.- Chapter 3 Investigation of Structural Defects in (Cd,Zn)Te Crystals Grown by the Traveling Heater Method.- Chapter 4 Solution Growth of CdZnTe Crystals for X-Ray Detector.- Chapter 5 3-Dimensional Mapping of Carrier Lifetime and Mobility.- Chapter 6  Investigation on the polarization effect and depolarization technique of CZT detector under high flux rate X/γ-ray irradiation.- Chapter 7 Research on the performance of CZT detector in alpha particle detection.- Chapter 8 CdZnTeSe: Recent advances for radiation detector applications.- Chapter 9 Investigation of charge transport properties and the role of point defects in CdZnTeSe room temperature radiation detectors.- Chapter 10 Charge sharingand cross-talk effects in high-Z and wide-bandgap compound semiconductor pixel detectors.- Chapter 11 Effect of electron irradiation on spectroscopic properties of Schottky-barrier CdTe semiconductor detectors.- Chapter 12. A Path to produce High-Performance CdZnTe crystals.

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