Failure Analysis : High Technology Devices (De Gruyter Stem)

Sullivan, Daniel J. D./ Carleton, Eric J.

De Gruyter（2022/10発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 150 p.
• 言語 ENG
• 商品コード 9781501524783

Full Description

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.