Bias Temperature Instability for Devices and Circuits

Grasser, Tibor (EDT)

Springer-Verlag New York Inc.（2016/10発売）

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製本 Paperback:紙装版/ペーパーバック版／ページ数 810 p.
言語 ENG
商品コード 9781493955299
DDC分類 621.3815

Full Description

Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.