Bias Temperature Instability for Devices and Circuits

Grasser, Tibor (EDT)

Springer-Verlag New York Inc.（2016/10発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 810 p.
• 言語 ENG
• 商品コード 9781493955299
• DDC分類 621.3815

Full Description

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Contents

Introduction.- Characterization, Experimental Challenges.- Advanced Characterization.- Characterization of Nanoscale Devices.- Statistical Properties/Variability.- Theoretical Understanding.- Possible Defects: Experimental.- Possible Defects: First Principles.- Modeling.- Technological Impact.- Silicon dioxides/SiON.- High-k oxides.- Alternative technologies.- Circuits.