Test and Diagnosis for Small-Delay Defects （2012）

Tehranipoor, Mohammad/ Peng, Ke/ Chakrabarty, Krishnendu

Springer-Verlag New York Inc.（2014/11発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 212 p.
• 言語 ENG
• 商品コード 9781489989529
• DDC分類 621

Full Description

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Contents

Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF.