Nyquist AD Converters, Sensor Interfaces and Robustness : Advances in Analog Circuit Design, 2012

van Roermund, A. H. (EDT)/ Baschirotto, A. (EDT)/ Steyaert, M. (EDT)

Springer（2012/10発売）

• 製本 Hardcover:ハードカバー版／ページ数 370 p.／サイズ 230 illus., 73 in color
• 言語 ENG
• 商品コード 9781461445869
• DDC分類 621

Full Description

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

Contents

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.