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Full Description
Sol-gel chemistry is widely used to make materials of desired shape and functionality. As these sol-gel materials have became more diverse and complex, the development of advanced characterization techniques has emerged as a critical issue. In this book, leading scientists and engineers summarize the state-of-the-art in characterization techniques for sol-gel materials and beyond. After an overview of sol-gel derived materials, Advanced Characterization Techniques for Sol-Gel Materials is organized into four main sections: Structural characterization; Surface and textural characterization; Local probe techniques; and, Nanostructured thin films, which places special emphasis on an area that has resulted in key industrial applications of sol-gel materials in the last decade.
Contents
Overview of sol-gel materials.- Structural characterization.- X-Ray and neutron diffraction.- Small angle scattering.- Vibrational spectroscopies.- Diffraction at the nanoscale, nanocrystals.- Surface and textural characterization.- Characterization of porous solids.- Thermoporosimetry and NMR cryoporometry.- Surface characterization.- X-ray photo electron spectroscopy.- Local probe techniques.- Advanced NMR techniques.- Electrochemical techniques.- X-Ray absorption techniques.- Thin film characterization.- Ellipsometry.- Waveguided spectroscopies.- In situ techniques for film formation, GISAXS.- Mechanical properties of thin films.
