Thermal Testing of Integrated Circuits

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Thermal Testing of Integrated Circuits

Altet

Springer（2011/11発売）

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ページ数 224 p.
商品コード 9781441952875

Full Description

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality.