強誘電性薄膜におけるナノスケール現象 Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)

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強誘電性薄膜におけるナノスケール現象<br>Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)

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強誘電性薄膜におけるナノスケール現象
Nanoscale Phenomena in Ferroelectric Thin Films (Multifunctional Thin Film Series)

Ed. by Seungbum Hong

ウェブストア価格 ¥45,841（本体¥41,674）
Springer（2004発売）
外貨定価 US$ 219.99
ポイント 416pt

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製本 Hardcover:ハードカバー版／ページ数 300 p.
言語 ENG
商品コード 9781402076305

基本説明

Consists of two main parts: Eelectrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials.

Full Description

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

I. Electrical Characterization in Nanoscale Ferroelectric Capacitor.- I. Testing and characterization of ferroelectric thin film capacitors.- II. Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size.- III. Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy.- IV. Nanoscale domain dynamics in ferroelectric thin films.- V. Polarization switching and fatigue of ferroelectric thin films studied by PFM.- II Nano Domain Manipulation and Visualization in Ferroelectric Materials.- VI. Domain switching and self-polarization in perovskite thin films.- VII. Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain.- VIII. Polarization and charge dynamics in ferroelectric materials with SPM.- IX. Nanoscale investigation of MOCVD-Pb(Zr,Ti)O3 thin films using scanning probe microscopy.- X. SPM measurements of ferroelectrics at MHz frequencies.- XI Application of ferroelectric domains in nanometer scale for high- density storage devices.