The 10th International Conference on X-ray Microscopy (Aip Conference Proceedings: Accelerators, Beams, and Instrumentations) / McNulty, Ian (EDT)/ Eyberger, Catherine E. (EDT)/ Lai, Barry (EDT)

The 10th International Conference on X-ray Microscopy (Aip Conference Proceedings: Accelerators, Beams, and Instrumentations) （2011TH）

McNulty, Ian (EDT)/ Eyberger, Catherine E. (EDT)/ Lai, Barry (EDT)

American Institute of Physics（2011/10発売）

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製本 Paperback:紙装版/ペーパーバック版／ページ数 486 p.
言語 ENG
商品コード 9780735409255
DDC分類 537.535

Full Description

This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.