X-Ray Optics and Microanalysis (Aip Conference Proceedings/atomic, Molecular, Chemical Physics)

Denecke, Melissa A. (EDT)/ Walker, Clive T. (EDT)

American Institute of Physics（2010/05発売）

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製本 Hardcover:ハードカバー版／ページ数 228 p.
言語 ENG
商品コード 9780735407640
DDC分類 543.62

Full Description

"ICXOM Series" is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.