Stress-Induced Phenomena in Metallization : Eighth International Workshop on Stress-induced Phenomena in Metallization (Aip Conference Proceedings Stress-induced Phenomena Metallizat) / Zschech, Ehrenfried (EDT)/ Maex, Karen (EDT)/ Ho, P. S. (EDT)

Stress-Induced Phenomena in Metallization : Eighth International Workshop on Stress-induced Phenomena in Metallization (Aip Conference Proceedings Stress-induced Phenomena Metallizat) （2006）

ポイントキャンペーン

Stress-Induced Phenomena in Metallization : Eighth International Workshop on Stress-induced Phenomena in Metallization (Aip Conference Proceedings Stress-induced Phenomena Metallizat) （2006）

Zschech, Ehrenfried (EDT)/ Maex, Karen (EDT)/ Ho, P. S. (EDT)

American Institute of Physics（2006/02発売）

ただいまウェブストアではご注文を受け付けておりません。 ⇒古書を探す

製本 Hardcover:ハードカバー版／ページ数 383 p.
言語 ENG
商品コード 9780735403109
DDC分類 621.38152

Full Description

These proceedings present current research on issues related to stress-induced phenomena in on-chip metal interconnects and solder joints. This volume will appeal to scientists, engineers, graduate students interested in research and development of microelectronic devices as well as technology integration, and semiconductor industry professionals and equipment suppliers.