Principles of Electron Optics, Volume 3 : Fundamental Wave Optics (2ND)

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Principles of Electron Optics, Volume 3 : Fundamental Wave Optics (2ND)

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  • 製本 Paperback:紙装版/ペーパーバック版/ページ数 558 p.
  • 言語 ENG
  • 商品コード 9780128189795
  • DDC分類 537.56

Full Description

Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more.

The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.

Contents

54. Introduction

Part XI - Wave Mechanics
55. The Schrödinger Equation
56. The Relativistic Wave Equation
57. The Eikonal Approximation
58. Paraxial Wave Optics
59. The General Theory of Electron Diffraction and Interference
60. Elementary Diffraction Patterns

Part XII, Electron Interference and Electron Holography
61. General Introduction
62. Interferometry
63. Holography

Part XIII, Theory of Image Formation
64. General Introduction
65. Fundamentals of Transfer Theory
66. The Theory of Bright-field Imaging.
67. Image Formation in the Scanning Transmission Electron Microscope
68. Statistical Parameter Estimation Theory

Part XIV - Electron-specimen Interactions
69. Electron Interactions in Thin Specimens

Part XV - Digital Image Processing
70. Introduction
71. Acquisition, Sampling and Coding
72. Enhancement
73. Linear Restoration
74. Nonlinear Restoration - the Phase Problem
75. Three-dimensional Reconstruction
76. Image Analysis
77. Microscope Parameter Measurement and Instrument Control

Part XVI - Coherence, Brightness and Spectral Functions
78. Coherence and the Brightness Functions
79. Wigner Optics

PART XVII - Vortex Studies, the Quantum Electron Microscope
80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope

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