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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)
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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)  Paperback,  言語：ENG

Bai, Xiao (EDT)/ Hancock, Edwin R. (EDT)/ Ho, Tin Kam (EDT)

  • Springer International Publishing AG（2018/08発売）
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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings (Lecture Notes in Computer Science)
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  • 電子版あり

Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings (Lecture Notes in Computer Science)  Paperback

Robles-Kelly, Antonio (EDT)/ Loog, Marco (EDT)/ Biggio, Battista (EDT)

  • ウェブストア価格 ¥11,380（本体¥10,346）
  • Springer International Publishing AG（2016/11発売）
  • ポイント 103pt
  • 海外取次在庫
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