Specimen Handling, Preparation, and Treatments in Surface Characterization (Methods of Surface Characterization)
  • 洋書

Specimen Handling, Preparation, and Treatments in Surface Characterization (Methods of Surface Characterization)  Paperback,  言語:ENG

Czanderna, Alvin W. (EDT)/ Powell, Cedric J. (EDT)/ Madey, Theodore E. (EDT)

  • ウェブストア価格 ¥35,662(本体¥32,420)
  • Springer-Verlag New York Inc.(2013/04発売)
  • ポイント 324pt
  • 海外取次在庫
Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)  Paperback,  言語:ENG

Czanderna, Alvin W. (EDT)/ Hercules, David M. (EDT)

  • ウェブストア価格 ¥11,535(本体¥10,487)
  • Springer-Verlag New York Inc.(2012/10発売)
  • ポイント 104pt
  • 海外取次在庫
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization)
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization)  Paperback,  言語:ENG

Czanderna, Alvin W./ Madey, Theodore E./ Powell, Cedric J.

  • ウェブストア価格 ¥35,662(本体¥32,420)
  • Springer(2010/12発売)
  • ポイント 324pt
  • 海外取次在庫
Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization) (1991)
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization) (1991)  Hardcover,  言語:ENG

Czanderna, Alvin W. (EDT)/ Hercules, David M. (EDT)

  • ウェブストア価格 ¥20,769(本体¥18,881)
  • Kluwer Academic/Plenum Publishers(1991/09発売)
  • ポイント 188pt
  • 海外取次在庫