Summary of a Workshop on the Technology, Policy, and Cultural Dimensions of Biometric Systems
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Summary of a Workshop on the Technology, Policy, and Cultural Dimensions of Biometric Systems  Paperback,  言語:ENG

Pato, Joseph N. (EDT)/ Millett, Lynette I. (EDT)/ Batch, Kristen (EDT)

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  • National Academies Press(2006/02発売)
  • ポイント 58pt
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