New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro & Nano Technologies)
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  • 電子版あり

New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro & Nano Technologies)  Paperback,  言語:ENG

Zalevsky, Zeev/ Livshits, Pavel/ Gur, Eran

  • ウェブストア価格 ¥10,197(本体¥9,270)
  • William Andrew Publishing(2013/11発売)
  • ポイント 92pt
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