Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings (Lecture Notes in Computer Science)
  • 洋書
  • 電子版あり

Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings (Lecture Notes in Computer Science)  Paperback

Robles-Kelly, Antonio (EDT)/ Loog, Marco (EDT)/ Biggio, Battista (EDT)

  • ウェブストア価格 ¥11,380(本体¥10,346)
  • Springer International Publishing AG(2016/11発売)
  • ポイント 103pt
  • 海外取次在庫
Computer Analysis of Images and Patterns : 15th International Conference, CAIP 2013, York, UK, August 27-29, 2013, Proceedings, Part II (Lecture Notes in Computer Science) (2013)
  • 洋書

Computer Analysis of Images and Patterns : 15th International Conference, CAIP 2013, York, UK, August 27-29, 2013, Proceedings, Part II (Lecture Notes in Computer Science) (2013)  Paperback,  言語:ENG

Wilson, Richard (EDT)/ Hancock, Edwin (EDT)/ Bors, Adrian (EDT)

  • ウェブストア価格 ¥11,380(本体¥10,346)
  • Springer-Verlag Berlin and Heidelberg GmbH & Co. K(2013/08発売)
  • ポイント 103pt
  • 海外取次在庫
Computer Analysis of Images and Patterns : 15th International Conference, CAIP 2013, York, UK, August 27-29, 2013, Proceedings, Part I (Image Processing, Computer Vision, Pattern Recognition, and Graphics) (2013)
  • 洋書

Computer Analysis of Images and Patterns : 15th International Conference, CAIP 2013, York, UK, August 27-29, 2013, Proceedings, Part I (Image Processing, Computer Vision, Pattern Recognition, and Graphics) (2013)  Paperback,  言語:ENG

Wilson, Richard (EDT)/ Hancock, Edwin (EDT)/ Bors, Adrian (EDT)

  • ウェブストア価格 ¥11,380(本体¥10,346)
  • Springer-Verlag Berlin and Heidelberg GmbH & Co. K(2013/08発売)
  • ポイント 103pt
  • 海外取次在庫
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)
  • 洋書
  • 電子版あり

Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)  Paperback,  言語:ENG

Bai, Xiao (EDT)/ Hancock, Edwin R. (EDT)/ Ho, Tin Kam (EDT)

  • Springer International Publishing AG(2018/08発売)
  • ご注文いただけません